EMBER – Emissivity Modified Band EmitteR technology is at the core of our pulsIR family of products. Fundamentally, this technology utilizes a random array of micron scale surface features to modify the emissivity of a metal foil. The surface texture is fabricated via a patented ion milling process and enables near blackbody radiation in both the 3-5 micron and 8-12 micron wavebands. The structure is highly stable and was originally designed for use in space flight calibration sources and infrared
telescope baffles.

PCE – Photonic Crystal Enhanced technology is at the core of our markIR and SensorChip families of products. Fundamentally this technology utilizes a metal coated silicon-air photonic crystal to dramatically mediate the emission profile of the material. The patented structure generates narrowband radiation that is tunable through tight control of the geometry of the photonic lattice. We have successfully fabricated emitters tailored to any wavelength throughout the infrared spectrum.

The Hot “Self” Bolometer is at the core of our SensorChip family of products. Fundamentally, this patented technology enables infrared gas measurements with a single discrete component. The device acts as both a hot infrared emitter as well as its own bolometric detector through the use of a retroreflecting mirror. In this geometry a steady state temperature is reached on the emitting element. When an absorbing gas removes some of the optical power from the system we observe a small bolometric change in temperature on the filament which we can measure and correlate to gas concentration.